Aspire - Conical AFM Tips

AspireTM AFM probes are conically-shaped AFM tips for the mass-market. Made of high quality, highly doped single crystal silicon, the aspire probes are robust and offer long imaging life.   AFM probe geometry plays an important role when imaging surfaces. Uniform, conical tip shapes, like the Aspire tips, guarantee the aquisition of truly symmetrical images.

SPM Probe Tips

SPM probe tips are for general use in most AFM systems. Team Nanotec offers a wide variety of probes for:  

• Surface Science, like MFM or EFM
• Material Science, like nano indentation
• Topography Imaging
• Step Height Measurements

Metrology Probes

Team Nanotec metrology probes for use in 3D-AFM systems comprise round probes for measureing line or trench width and shape as well as cylindrical probes for depth measurements. Flared CD probes are used for determing sidewall roughness.

Probe tip characterizers

Probe tip characterizers are used to check the shape and the dimension of the probe tip. Each cell is numbered, which facilitates recalibration at the identical position.