AFM Special

Whisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary precision.

Super sharp silicon probes and diamond-like carbon DLC tips with typical curvature radius 1-2nm are extremely useful for obtaining high resolution of nanostructures. DLC tips have very long lifetime due to the high material durability.

Diamond Coated Probes are the best choice for any kind of long-term characterizations. Stable and nondestructive, wear resistant probes with diamond coating allow you to make as many images as you want.

The best choice for the applications where the tip has to be placed exactly on the point of interest and/or has to be visible for Nanomanipulation.

Various colloidal sphere-tips for direct surface force measurement, measurement of adhesion forces, studying of colloidal interactions between a particle and a surface and many other applications.

We would like to present you our new products - Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole working day and more! Using the probes you don’t need to choose between performance, lifetime and price anymore. Diamond manufacturing technology provides both sharp and wear-resistant, high quality AFM probes at a realistic price. The main probe advantages:

• High Resolution Diamond Tip – typical tip radius 7nm for both topography and electrical measurements.
• Endurance of Diamond - at least 10x Lifetime of Silicon.
• Standard AFM chip size.

Sharp, single crystal diamond AFM probes give the AFM user all the known resilience benefits of hard diamond, with no compromise on image resolution.