“Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface
Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging
Several variations to suit different modes of AFM and special applications like EFM
Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid
Uncoated/aluminum coated (reflex side) probes are suitable for applications in air
Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc.
Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc.,
Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc.”
ACCESS-C
AppNano ACCESS-C™ probes are sharp silicon probes for contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 6;Coating: none Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating:None;k:0.3(0.1-0.9)N/m;f:16.0(8.0-25.0)kHz;Length:450.0(430.0-470.0)µm;Width49.5(49.0-50.0)µm;Thickness2.50(1.50-3.50) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-C-10 | k:0.3N/m;f:16kHz;Tip-view-Contact mode, Uncoated, Si probe;10/box |
each | $418.00 |
ACCESS-FM
AppNano ACCESS-FM™ probes are sharp silicon probes for force calibration mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 6;Coating: none Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating:None;k:2.7(0.8-8.9)N/m;f:60.0(36.0-98.0)kHz;Length:245.0(225.0-265.0)µm;Width52.0(51.0-53.0)µm;Thickness2.80(1.80-3.80) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-FM-10 | k:2.7N/m;f:60kHz;Tip view- Force modulation in liquid, Uncoated, Si probe;10/box |
each | $418.00 | |
| hrtest | ilabilab hr test no sales  |
each | $10,000.00 |
ACCESS-NC
AppNano ACCESS-NC™ probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 6;Coating: none Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating:None;k:93(34-243)N/m;f:320.0(201.0-508.0)kHz;Length:150.0(130.0-170.0)µm;Width54.0(52.0-56.0)µm;Thickness5.50(4.50-6.50) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-NC-10 | k:93N/m;f:320kHz;Tip view-Tapping?/Non-contact mode in air, Uncoated, Si probe;10/box |
each | $418.00 |
ACCESS-EFM
AppNano ACCESS-EFM™ probes are sharp silicon probes for Electric Force Mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes have a medium frequency and spring constant that make them ideally suited for Electric Force Microscopy. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 30;Coating: Platinum Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating:Platinum;k:2.7(0.8-8.9)N/m;f:60.0(36.0-98.0)kHz;Length:245.0(225.0-265.0)µm;Width52.0(51.0-53.0)µm;Thickness2.80(1.80-3.80) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-EFM-10 | k:2.7N/m;f:60kHz; PtIr coated- Tip view- Force modulation EFM, Si probe;10/box |
each | $534.00 |
ACCESS-FM-GG
AppNano ACCESS-FM-GG™ probes are sharp silicon probes coated with Gold on reflex and tip side for force calibration mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 30;Coating: Gold Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating:Gold;k:2.7(0.8-8.9)N/m;f:60.0(36.0-98.0)kHz;Length:245.0(225.0-265.0)µm;Width52.0(51.0-53.0)µm;Thickness2.80(1.80-3.80) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-FM-GG-10 | k:2.7N/m;f:60kHz; Au coated- Tip view- Tapping?/Non-contact EFM, Si probe;10/box |
each | $534.00 |
ACCESS-NC-GG
AppNano ACCESS™-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 14-16;ROC (nm) : 30;Coating: Au, 35 nm ± 5 nm Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating: Au, 35 nm ± 5 nm;k:93(34-243)N/m;f:320.0(201.0-508.0)kHz;Length:150.0(130.0-170.0)µm;Width54.0(52.0-56.0)µm;Thickness5.50(4.50-6.50) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-NC-GG-10 | k:93N/m;f:320kHz; Au coated- Tip view-Tapping?/Non-contact EFM, Si Probe;10/box |
each | $534.00 |
DD-ACCESS-NC-A
Doped Diamond coated Si probes; L=160 um, f=300 kHz, k=93 N/m; Tip ROC=100-300 um; Al coated (reflex side); 5 probes/box Tip Specifications Material: Silicon;Shape: Pyramidal;Height (µm): 14-16;ROC (nm) : 100-300;Aspect ratio:1.5-3.0 Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating: Al, 50 nm ± 5 nm;k:93(34-243)N/m;f:320.0(201.0-508.0)kHz;Length:150.0(130.0-170.0)µm;Width54.0(52.0-56.0)µm;Thickness5.50(4.50-6.50) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| DD-ACCESS-NC-A-5 | k:93N/m;f:320kHz; Doped diamond coated- Tip view- Tapping?/Non-contact EFM, Al on reflex side, Si probe;5/box |
each | $865.00 |
ACCESS-UHF
AppNano ACCESS™-UHF Fast Scanning probes are sharp silicon probes for fast and high resolution imaging and tapping / non-contact mode applications that allow a direct optical view of the AFM tip. Designed for applications that require seeing the tip as it engages the surface, these probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Tip Specifications Material: Silicon;Shape: Triangular Pyramid;Height (µm): 8-12;ROC (nm) : 6;Coating:None Cantilever Specifications: Material:Silicon;Shape:Rectangular;Reflex coating: None;k:115(31-391)N/m;f:1100.0(600.0-2000.0)kHz;Length:55.0(45.0-65.0)µm;Width25.0(26.0-27.0)µm;Thickness2.80(1.80-3.80) µm
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| ACCESS-UHF-10 | k:115N/m;f:1100kHz; Ultra-high frequency scanning, Uncoated, Tip view-Si probe;10/box |
each | $495.00 |
hrtest
hrtest
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| hrtest | ilabilab hr test no sales |
each | $10,000.00 |
| Product# | Description | Unit | Price | Qty / Quote |
|---|---|---|---|---|
| each | $0.00 |