Appnano-Calibration Standards/Test Samples

Our multipurpose Nanuler Calibration Standard is designed for calibration of AFM, SEM, Optical and Mechanical Profilers. Features include step heights, lines, grids, magnification box and spot measurement structures of different pitch. The features are etched into SiO₂ and Si and are optionally available with metal coating for improved reflectivity and reduced static charge.

"EFM test sample is designed to use as a reference to study the surface electric properties using AFM Sample contains two micro comb shaped structures connected with thin metal pads (30 nm Cr) Thin pads extended to thick metal pads for wire bonding for applying external bias/grounding"

"A micro heater fabricated on a silicon chip to qualify VertiSense™ thermal module functionality It comes with a battery pack to supply power to the heater Micro heater size is about 5 µmx10 µm The features are etched into SiO₂ and Si Hot spot of the micro heater is capable of reaching up to 80 °C"

"Used to calibrate VertiSense™ Thermal Probes to accurately measure temperatures Can also be used to heat the samples for AFM studies Consists of a micro heater integrated with K-type thermocouple PID controller maintains the heater temperature with feedback from the thermocouple VertiSense™ App guides the thermal calibration procedure on the controller"

We provide a five cantilever chip for calibrating the spring constant of AFM probes They are available in with or without gold coating