AFM accessories-Appnano-silion prober

AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon. We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market.

AppNano offers two series of silicon nitride cantilevered probes: Hydra series- a hybrid probe with nitride cantilever and a silicon tip and Nitra series- features both the cantilever and tip made up of silicon nitride

Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging Several variations to suit different modes of AFM and special applications like EFM Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid Uncoated/aluminum coated (reflex side) probes are suitable for applications in air Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc. Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc., Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc.

AppNano offers special metal coating on our highly conductive doped silicon probes for advanced AFM applications like electric force microscopy (EFM) and magnetic force microscopy (MFM) Optimal thickness and highest quality metal coating coupled with our proprietary process achieve best conductivity (sensitivity and lifetime) without compromising tip sharpness (high resolution) Gold coated (GG) probes offer excellent conductivity and chemical stability, are suitable for intermittent/non-contact EFM applications like Electrostatic force microscopy/KPFM, etc. Platinum-Iridium (Pt-Ir) coated probes offer excellent conductivity and good mechanical stability are optimal for contact as well as non-contact EFM techniques Doped diamond coated probes have excellent wear resistance and conductivity, ideal choice for hard contact studies like SSRM, CAFM, SCM as well as electrostatic FM, KPFM, etc. Our new Titanium nitride (TiN) probes offer best conductivity, voltage stability and very good wear resistance. Recommended for Contact as well as Intermittent/Non-contact EFM studies Cobalt-chromium (Co-Cr) coated probes are designed for MFM applications

Different spike length options (1/2/4/6 µm) Different tilt angle compensation (0/3/12°)

A major breakthrough in SThM technology- VertiSense™ <50 nm thermal spatial resolution (up to 20 nm) 0.01 °C sensitivity Temperature measurements up to 700 °C VertiSense was awarded industry’s most prestigious 2014 R&D 100 2014 Microscopy Today Innovation Awards VertiSense™ salient features: Plug-in module, compatible with most commercial AFMs Innovative probe design Accurate temperature measurement Ultra-high thermal spatial resolution: up to 20 nm Exquisite temperature sensitivity: 0.01 °C Temp. measurements up to 700° C Imaging in temperature mapping mode and conductivity mapping modes Supports Contact, Tapping™ and Peak Force Tapping modes Ultra-low noise, high speed amplifier Accurate & precise measurements Bluetooth® wireless controller Real Time temperature display Inbuilt probe calibration wizard Complete control of Imaging amplifier

AppNano offers: Step Height Standard (SHS) Electric Force Microscopy (EFM) Test Sample VertiSense™ Thermal Test Sample VertiSense™ Thermal Calibration Module Force Calibration Levers (FCL) to determine spring constant

"The AppNano STM Tip Etcher is a compact, easy to use system for etching custom STM tips with a user-controlled timed etch. The etcher features an automatic tip etch stop, an automatic dip and retract, and a live tip etch view. The machine uses pulse etching technology for highly controlled and reproducible tip ROC and aspect ratio. The pulse width is variable for creating custom tip shapes. An optional electroplating mode enablesnanometre scale metal deposition.Etch type: DC PWM Selectable etch Voltage: 1.5V to 12V Voltage display: 3.5 digit DVM Current max: 1A Slow etch: selectable 0.1% to 4% ""on"" at 10Hz Fast etch: selectable 4% to 40% ""on"" at 100Hz Optical view: ~200X digital microscope Surface detect: electronic detection of the etch liquid surface w/ LED indicator Tip etch control: Linear Servo with 15 mm travel, 0.02 mm step resolution Tip taper distance: 2 mm (can be specified shorter or longer). Optional electroplating mode"