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Silicon Probes

Silicon Probes

SKU: #001 - In Stock
USD$100.00 USD$0.00 (% off)
Wholesale Price:
Qty Price
10-20 USD$-5.00

  • airport Shipping:  International shipping available
  •  Shipping time:   Standar(10-20 business days), Rush(5-10 business days)
  • chip Discount:  Get 2% discount on orders of USD $100.00,Get 3% discount on orders of USD $200.00
  • compass Handling time:  Ships within 3 business days after receiving cleared payment
  • available_updates Returns:  7 days money back guaratee,buyer pays return shipping

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  • AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon

  • Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness

  • We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market

Tapping mode AFM probes TAPPING MODE PROBES

ACL Series:

  • Designed for Tapping™/Non-contact mode applications


  • Features long, thick and wide cantilever for greater laser clearance

  • Available with different tip and cantilever options for different applications

ACL- Long Tapping mode AFM probe

Cantilever Specs. *
k (N/m) 58
f (kHz) 190
Length (μm) 225
Width (μm) 40
Thickness (µm) 7.8
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG) (GG)

  • Super Sharp (SS)

  • Tipless (TL)

  • None


ACST Series:

  • Designed for soft Tapping™/Non-contact mode applications


  • Features reasonably soft and mid-range resonance frequency cantilever

  • Available with different tip and cantilever options for different applications

ACST- Soft Tapping Mode AFM Probe

Cantilever Specs. *
k (N/m) 7.8
f (kHz) 150
Length (μm) 150
Width (μm) 28
Thickness (µm) 3
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Uncoated

  • Au coating (GG)

  • Super Sharp (SS)

  • Tipless (TL)


ACT series:

  • Short and stiff cantilever with high resonance frequency for high speed scanning of hard samples in Tapping™/Non-contact modes

  • Available with different tip and cantilever options for variety of applications

ACT- Hard Tapping mode AFM probe

Cantilever Specs. *
k (N/m) 37
f (kHz) 300
Length (μm) 125
Width (μm) 30
Thickness (µm) 4
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)

  • Ball tip

  • Doped Diamond

  • Plateau (PTU)

  • Super Sharp (SS)

  • Tipless (TL)

  • None

Force Modulation AFM Probes FORCE MODULATION PROBES

FORT series:

  • Features medium spring constant and frequency cantilevers for force modulation mode

  • FORT probes are specially designed for this mode

  • A variety of tip and cantilever options available for different microscopy applications

FORT AFM Probes

Cantilever Specs. *
k (N/m) 1.6
f (kHz) 61
Length (μm) 225
Width (μm) 27
Thickness (µm) 2.7
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)

  • Ball tip

  • Doped Diamond

  • Plateau (PTU)

  • Super Sharp (SS)

  • Tipless (TL)

  • None

Contact Mode AFM Probes CONTACT MODE PROBES

SHOCON series:

  • Soft and short (high sensitivity) cantilever for contact mode applications

  • Available with different tip and cantilever options for imaging in air or liquid media

SHOCON- Short Contact Mode AFM Probe

Cantilever Specs. *
k (N/m) 0.14
f (kHz) 21
Length (μm) 225
Width (μm) 46
Thickness (µm) 1
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)

  • Super Sharp (SS)

  • Tipless (TL)

  • None


SICON series:

  • Features long and soft cantilever for contact mode applications

  • Long cantilever provides better laser clearance and low spring constant

  • A variety of tip and cantilever options available for different contact mode applications

SICON- Long Contact Mode AFM Probe

Cantilever Specs. *
k (N/m) 0.29
f (kHz) 15
Length (μm) 450
Width (μm) 49
Thickness (µm) 1
Coating (reflex side)
  • Al

  • Au

  • None

Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)

  • Ball tip

  • Doped Diamond

  • Plateau (PTU)

  • Super Sharp (SS)

  • Tipless (TL)

  • None

Super Sharp (SS)- High Resolution AFM Probes SUPER SHARP (SS) SERIES

Super Sharp (SS) series:

  • Super sharp tip (ROC: 1-2 nm) option available on all our silicon probes

  • Specially fabricated for super resolution imaging

  • Available with different coating options for imaging in air/liquid media

Supersharp AFM probe

Cantilever choices Available on all standard silicon probes like ACL, ACT, ACST, FORT, SICON and SHOCO
Coating (reflex side)
  • Al

  • None

Special options
  • Au/Pt coating (reflex side)

Tipless (TL) series probes TIP LESS (TL) SERIES

Tipless (TL) series:

  • Available on all our silicon and silicon nitride probes for custom applications

  • Available with different coating options for applications in air/liquid media

Tipless probe

Cantilever choices Available on all standard silicon and silicon nitride probes like ACL, ACST, ACT, FORT, SHOCON, SICON and HYDRA series.
Coating (reflex side)
  • Al

  • Au

  • None

Special options
  • Au (Both sides)

  • Pt (Both sides)

* - Nominal values


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