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AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon
Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness
We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
TAPPING MODE PROBES
Designed for Tapping™/Non-contact mode applications
Features long, thick and wide cantilever for greater laser clearance
Available with different tip and cantilever options for different applications
Cantilever Specs. * | |
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k (N/m) | 58 |
f (kHz) | 190 |
Length (μm) | 225 |
Width (μm) | 40 |
Thickness (µm) | 7.8 |
Coating (reflex side) |
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Tip specs. * | |
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Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
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Designed for soft Tapping™/Non-contact mode applications
Features reasonably soft and mid-range resonance frequency cantilever
Available with different tip and cantilever options for different applications
Cantilever Specs. * | |
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k (N/m) | 7.8 |
f (kHz) | 150 |
Length (μm) | 150 |
Width (μm) | 28 |
Thickness (µm) | 3 |
Coating (reflex side) |
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Tip specs. * | |
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Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
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Short and stiff cantilever with high resonance frequency for high speed scanning of hard samples in Tapping™/Non-contact modes
Available with different tip and cantilever options for variety of applications
Cantilever Specs. * | |
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k (N/m) | 37 |
f (kHz) | 300 |
Length (μm) | 125 |
Width (μm) | 30 |
Thickness (µm) | 4 |
Coating (reflex side) |
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Tip specs. * | |
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Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
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FORCE MODULATION PROBES
Features medium spring constant and frequency cantilevers for force modulation mode
FORT probes are specially designed for this mode
A variety of tip and cantilever options available for different microscopy applications
Cantilever Specs. * | |
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k (N/m) | 1.6 |
f (kHz) | 61 |
Length (μm) | 225 |
Width (μm) | 27 |
Thickness (µm) | 2.7 |
Coating (reflex side) |
|
Tip specs. * | |
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Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
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CONTACT MODE PROBES
Soft and short (high sensitivity) cantilever for contact mode applications
Available with different tip and cantilever options for imaging in air or liquid media
Cantilever Specs. * | |
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k (N/m) | 0.14 |
f (kHz) | 21 |
Length (μm) | 225 |
Width (μm) | 46 |
Thickness (µm) | 1 |
Coating (reflex side) |
|
Tip specs. * | |
---|---|
Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
|
Features long and soft cantilever for contact mode applications
Long cantilever provides better laser clearance and low spring constant
A variety of tip and cantilever options available for different contact mode applications
Cantilever Specs. * | |
---|---|
k (N/m) | 0.29 |
f (kHz) | 15 |
Length (μm) | 450 |
Width (μm) | 49 |
Thickness (µm) | 1 |
Coating (reflex side) |
|
Tip specs. * | |
---|---|
Material | Silicon |
ROC (nm) | 6 |
Height (μm) | 14-16 |
Shape | Tetrahedral |
Options |
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SUPER SHARP (SS) SERIES
Super sharp tip (ROC: 1-2 nm) option available on all our silicon probes
Specially fabricated for super resolution imaging
Available with different coating options for imaging in air/liquid media
Cantilever choices | Available on all standard silicon probes like ACL, ACT, ACST, FORT, SICON and SHOCO |
Coating (reflex side) |
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Special options |
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TIP LESS (TL) SERIES
Available on all our silicon and silicon nitride probes for custom applications
Available with different coating options for applications in air/liquid media
Cantilever choices | Available on all standard silicon and silicon nitride probes like ACL, ACST, ACT, FORT, SHOCON, SICON and HYDRA series. |
Coating (reflex side) |
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Special options |
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* - Nominal values
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